Heighway, P. G., Peake, D. J., Stevens, T. et al. (119 more authors) (2025) X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids. Journal of Applied Physics. 155903. ISSN: 1089-7550
Abstract
We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.
Metadata
| Item Type: | Article |
|---|---|
| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | Publisher Copyright: © 2025 Author(s). |
| Dates: |
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| Institution: | The University of York |
| Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) |
| Date Deposited: | 21 Nov 2025 14:40 |
| Last Modified: | 21 Nov 2025 14:40 |
| Published Version: | https://doi.org/10.1063/5.0295250 |
| Status: | Published |
| Refereed: | Yes |
| Identification Number: | 10.1063/5.0295250 |
| Related URLs: | |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:234774 |
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Filename: 155903_1_5.0295250.pdf
Description: X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids
Licence: CC-BY-NC-ND 2.5

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