Direct Identification of Monolayer Rhenium Diselenide by an Individual Diffraction Pattern

Fei, Zhen, Wang, Bo, Ho, Ching-Hwa et al. (4 more authors) (2017) Direct Identification of Monolayer Rhenium Diselenide by an Individual Diffraction Pattern. Nano Research. pp. 2535-2544. ISSN 1998-0124

Abstract

Metadata

Item Type: Article
Authors/Creators:
Copyright, Publisher and Additional Information:

This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details

Keywords: electron diffraction,monolayer,reciprocal rel-rod,rhenium diselenide
Dates:
  • Published: 1 July 2017
  • Published (online): 19 May 2017
  • Accepted: 18 April 2017
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 07 Jun 2017 09:15
Last Modified: 16 Oct 2024 13:49
Published Version: https://doi.org/10.1007/s12274-017-1639-7
Status: Published
Refereed: Yes
Identification Number: 10.1007/s12274-017-1639-7
Related URLs:
Open Archives Initiative ID (OAI ID):

Downloads

Filename: Electronic_Supplementary_Material.pdf

Description: Electronic_Supplementary_Material

Export

Statistics