Items where authors include "Si, J."

Article

Xu, C., Di Lonardo Burr, S. orcid.org/0000-0001-6338-9621, Rodgers, L.J. et al. (5 more authors) (2025) A longitudinal investigation of the co-development and bidirectional relations among whole number arithmetic and conceptual and procedural fraction knowledge. Journal of Educational Psychology. ISSN 0022-0663

Xu, C., Di Lonardo Burr, S. orcid.org/0000-0001-6338-9621, Li, H. et al. (2 more authors) (2024) From whole numbers to fractions to word problems: hierarchical relations in mathematics knowledge for Chinese Grade 6 students. Journal of Experimental Child Psychology, 242. 105884. ISSN 0022-0965

Xu, C. orcid.org/0000-0002-6702-3958, Li, H. orcid.org/0000-0002-5052-2742, Di Lonardo Burr, S. orcid.org/0000-0001-6338-9621 et al. (3 more authors) (2024) We cannot ignore the signs: the development of equivalence and arithmetic for students from grades 3 to 4. Journal of Cognition and Development, 25 (1). pp. 46-65. ISSN 1524-8372

Di Lonardo Burr, S.M. orcid.org/0000-0001-6338-9621, Xu, C. orcid.org/0000-0002-6702-3958, Li, H. orcid.org/0000-0002-5052-2742 et al. (3 more authors) (2022) Fraction mapping and fraction comparison skills among grade 4 Chinese students: An error analysis. British Journal of Educational Psychology, 92 (4). pp. 1335-1353. ISSN 0007-0998

Xu, C., Li, H., Di Lonardo Burr, S. et al. (3 more authors) (2022) Divide and conquer: Relations among arithmetic operations and emerging knowledge of fraction notation for Chinese students in Grade 4. Journal of Experimental Child Psychology, 217. 105371. ISSN 0022-0965

Proceedings Paper

Si, J., Peng, X. orcid.org/0000-0001-5787-9982, Li, C. et al. (2 more authors) (2022) Generating disentangled arguments with prompts: a simple event extraction framework that works. In: Proceedings of ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP). ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), 23-27 May 2022, Singapore, Singapore. IEEE , pp. 6342-6346. ISBN 9781665405416