Items where authors include "Shin, D."

Article

Khan, Z.A. orcid.org/0000-0002-3935-2148, Shin, D. orcid.org/0000-0002-0840-6449, Bianculli, D. orcid.org/0000-0002-4854-685X et al. (1 more author) (2024) Impact of log parsing on deep learning-based anomaly detection. Empirical Software Engineering, 29 (6). 139. ISSN 1382-3256

Hadadi, F. orcid.org/0009-0001-8755-3323, Dawes, J.H., Shin, D. orcid.org/0000-0002-0840-6449 et al. (2 more authors) (2024) Systematic evaluation of deep learning models for log-based failure prediction. Empirical Software Engineering, 29. 105. ISSN 1382-3256

Clun, D., Shin, D. orcid.org/0000-0002-0840-6449, Filieri, A. et al. (1 more author) (2024) Rigorous assessment of model inference accuracy using language cardinality. ACM Transactions on Software Engineering and Methodology, 33 (4). 95. pp. 1-39. ISSN 1049-331X

Shin, Y.-J., Shin, D. orcid.org/0000-0002-0840-6449 and Bae, D.-H. (2024) Virtual environment model generation for CPS goal verification using imitation learning. ACM Transactions on Embedded Computing Systems, 23 (1). 13. pp. 1-29. ISSN 1539-9087

Baek, Y.-M. orcid.org/0000-0002-9796-3756, Cho, E., Shin, D. orcid.org/0000-0002-0840-6449 et al. (1 more author) (2024) An extensible modeling method supporting ontology-based scenario specification and domain-specific extension. International Journal of Software Engineering and Knowledge Engineering, 34 (1). pp. 91-162. ISSN 0218-1940

Sharifi, S., Shin, D. orcid.org/0000-0002-0840-6449, Briand, L.C. et al. (1 more author) (2023) Identifying the hazard boundary of ML-enabled autonomous systems using cooperative co-evolutionary search. IEEE Transactions on Software Engineering, 49 (12). pp. 5120-5138. ISSN 0098-5589

Biagiola, M., Cardozo, N., Shin, D. orcid.org/0000-0002-0840-6449 et al. (3 more authors) (2023) Summary of the fourth international workshop on deep learning for testing and testing for deep learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48 (4). pp. 39-40. ISSN 0163-5948

Shin, D. orcid.org/0000-0002-0840-6449, Bianculli, D. and Briand, L. (2022) PRINS : scalable model inference for component-based system logs. Empirical Software Engineering, 27 (4). 87. ISSN 1382-3256

Kim, E.-H., Kim, E.-S., Shin, D. et al. (9 more authors) (2021) Carnosine protects against cerebral ischemic injury by inhibiting matrix-metalloproteinases. International Journal of Molecular Sciences, 22 (14). 7495.

Proceedings Paper

Gu, R., Rojas, J.M. and Shin, D. orcid.org/0000-0002-0840-6449 (2024) Can test generation and program repair inform automated assessment of programming projects? In: 2025 IEEE Conference on Software Testing, Verification and Validation (ICST). 18th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2025, 31 Mar - 04 Apr 2025, Naples, Italy. Institute of Electrical and Electronics Engineers (IEEE) . (In Press)

Osikowicz, O., McMinn, P. and Shin, D. orcid.org/0000-0002-0840-6449 (2024) Empirically evaluating flaky tests for autonomous driving systems in simulated environments. In: 2025 IEEE/ACM International Flaky Tests Workshop (FTW) Proceedings. 2nd IEEE/ACM International Flaky Tests Workshop (FTW 2025), 27 Apr 2025, Ottawa, Ontario, Canada. Institute of Electrical and Electronics Engineers (IEEE) . (In Press)

Shin, D. orcid.org/0000-0002-0840-6449 and Pennada, S. (2024) Towards simplification of failure scenarios for machine learning-enabled autonomous systems. In: 2024 IEEE 24th International Conference on Software Quality, Reliability, and Security Companion (QRS-C). 2024 IEEE 24th International Conference on Software Quality, Reliability, and Security Companion (QRS-C), 01-05 Jul 2024, Cambridge, United Kingdom. Institute of Electrical and Electronics Engineers (IEEE) , pp. 1089-1090. ISBN 9798350365665

Liang, W., Baldivieso, P.R., Drummond, R. orcid.org/0000-0002-2586-1718 et al. (1 more author) (2024) Tuning the feedback controller gains is a simple way to improve autonomous driving performance. In: 2024 UKACC 14th International Conference on Control (CONTROL). 2024 UKACC 14th International Conference on Control (CONTROL), 10-12 Apr 2024, Winchester, United Kingdom. Institute of Electrical and Electronics Engineers (IEEE) , pp. 72-77. ISBN 979-8-3503-7427-8

Ceci, M. orcid.org/0000-0003-3800-0906, Sannier, N. orcid.org/0000-0002-4449-5792, Abualhaija, S. orcid.org/0000-0001-6095-447X et al. (3 more authors) (2024) Toward automated compliance checking of fund activities using runtime verification techniques. In: FinanSE '24: Proceedings of the 1st IEEE/ACM Workshop on Software Engineering Challenges in Financial Firms. FinanSE '24: 1st IEEE/ACM Workshop on Software Engineering Challenges in Financial Firms, 16 Apr 2024, Lisbon, Portugal. Association for Computing Machinery , New York, United States , pp. 19-20. ISBN 9798400705687

Ul Haq, F., Shin, D. orcid.org/0000-0002-0840-6449 and Briand, L.C. (2023) Many-objective reinforcement learning for online testing of DNN-enabled systems. In: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE). 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE), 14-20 May 2023, Melbourne, Australia. Institute of Electrical and Electronics Engineers (IEEE) , pp. 1814-1826. ISBN 9781665457026

Dawes, J.H. orcid.org/0000-0002-2289-1620, Shin, D. orcid.org/0000-0002-0840-6449 and Bianculli, D. orcid.org/0000-0002-4854-685X (2023) Towards log slicing. In: Lambers, L. and Uchitel, S., (eds.) Fundamental Approaches to Software Engineering: 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, Paris, France, April 22–27, 2023, Proceedings. 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, 22-27 Apr 2023, Paris, France. Lecture Notes in Computer Science, 13991 . Springer Cham , pp. 249-259. ISBN 9783031308253

Haq, F.U., Shin, D. orcid.org/0000-0002-0840-6449 and Briand, L. (2022) Efficient online testing for DNN-enabled systems using surrogate-assisted and many-objective optimization. In: Proceedings of the 44th International Conference on Software Engineering. 44th International Conference on Software Engineering (ICSE '22), 21-29 May 2022, Pittsburgh, Pennsylvania, USA. Association for Computing Machinery , pp. 811-822. ISBN 9781450392211

Khan, Z.A., Shin, D. orcid.org/0000-0002-0840-6449, Bianculli, D. et al. (1 more author) (2022) Guidelines for assessing the accuracy of log message template identification techniques. In: ICSE '22: Proceedings of the 44th International Conference on Software Engineering. 44th International Conference on Software Engineering (ICSE '22), 21-29 May 2022, Pittsburgh, Pennsylvania, USA. Association for Computing Machinery , pp. 1095-1106. ISBN 9781450392211

Borg, M., Abdessalem, R.B., Nejati, S. et al. (2 more authors) (2021) Digital Twins Are Not Monozygotic – cross-replicating ADAS testing in two industry-grade automotive simulators. In: 2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST). 2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST), 12-16 Apr 2021, Porto de Galinhas, Brazil. Institute of Electrical and Electronics Engineers (IEEE) , pp. 383-393. ISBN 9781728168371

Shin, D. orcid.org/0000-0002-0840-6449, Yoo, S. and Bae, D.-H. (2016) Diversity-aware mutation adequacy criterion for improving fault detection capability. In: 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW). 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), 11-15 Apr 2016, Chicago, IL, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 122-131. ISBN 9781509036752

Shin, D. orcid.org/0000-0002-0840-6449 and Bae, D.-H. (2016) A theoretical framework for understanding mutation-based testing methods. In: 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST). 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST), 11-15 Apr 2016, Chicago, IL, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 299-308. ISBN 9781509018260