Items where authors include "Hu, Yuchen"

Proceedings Paper

Zhou, Jie, Ji, Youshu, Wang, Ning et al. (7 more authors) (2025) Insights from Rights and Wrongs:A Large Language Model for Solving Assertion Failures in RTL Design. In: 62nd DAC, Chips to Systems Conference, proceedings. 62nd Design Automation Conference, 22-25 Jun 2025, Moscone West. , USA .

Hu, Yuchen, Ye, Junhao, Xu, Ke et al. (11 more authors) (2025) UVLLM:An Automated Universal RTL Verification Framework using LLMs. In: 62nd DAC, Chips to Systems Conference, proceedings. 62nd Design Automation Conference, 22-25 Jun 2025, Moscone West. , USA .

Xu, Ke, Sun, Jualin, Hu, Yuchen et al. (4 more authors) (2025) MEIC:Re-thinking RTL debug automation using LLMs. In: ICCAD '24:Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design. Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 27-31 Oct 2024, Newark Liberty International Airport Marriott. ACM , USA .