Items where authors include "Du, J."

Article

Da Silva, A.C. orcid.org/0000-0002-6258-9506, Amadou‐Douah, C., Koiliari, S. et al. (4 more authors) (2024) Electrochemically driven assembly of chitosan hydrogels on PEDOT surfaces. Macromolecular Materials and Engineering, 309 (2). 2300263. ISSN 1438-7492

Liu, Z. orcid.org/0000-0002-0086-5659, Kimball, J.S., Ballantyne, A. et al. (8 more authors) (2024) Widespread deepening of the active layer in northern permafrost regions from 2003 to 2020. Environmental Research Letters, 19 (1). 014020. ISSN 1748-9326

Du, J., Kong, Z., Sun, A. et al. (4 more authors) (2023) MADDPG-based joint service placement and task offloading in MEC empowered air-ground integrated networks. IEEE Internet of Things Journal, 11 (6). pp. 10600-10615. ISSN 2327-4662

Ma, Y.-J., Moazamian, D., Port, J.D. et al. (15 more authors) (2023) Targeted magnetic resonance imaging (tMRI) of small changes in the T1 and spatial properties of normal or near normal appearing white and gray matter in disease of the brain using divided subtracted inversion recovery (dSIR) and divided reverse subtracted inversion recovery (drSIR) sequences. Quantitative Imaging in Medicine and Surgery, 13 (10). pp. 7304-7337. ISSN 2223-4292

He, X. orcid.org/0000-0002-2214-9338, Jiang, X. orcid.org/0000-0003-4141-1538, Spracklen, D.V. orcid.org/0000-0002-7551-4597 et al. (8 more authors) (2023) Global distribution and climatic controls of natural mountain treelines. Global Change Biology. ISSN 1354-1013

Du, J., Franklin, S. and Weber, B. (2023) A force controlled tribometer for pre-sliding measurements at the nanometer scale. Frontiers in Mechanical Engineering, 9. 1019979. ISSN 2297-3079

Wang, X., Du, J., Xie, C. et al. (5 more authors) (2023) Prior knowledge auxiliary for few-shot pest detection in the wild. Frontiers in Plant Science, 13. ISSN 1664-462X

Wang, Y. orcid.org/0000-0002-0830-4434, Li, C., Du, J. et al. (1 more author) (2022) Understanding the Influences of Multiscale Waviness on the Elastohydrodynamic Lubrication Performance, Part I: The Full-Film Condition. Lubricants, 10 (12). 368. ISSN 2075-4442

Du, J. orcid.org/0000-0002-0845-4942, Cheng, W., Lu, G. orcid.org/0000-0002-3938-9207 et al. (4 more authors) (2022) Resource pricing and allocation in MEC enabled blockchain systems: an A3C deep reinforcement learning approach. IEEE Transactions on Network Science and Engineering, 9 (1). pp. 33-44. ISSN 2327-4697

Du, J., Hartley, C., Brooke-Wavell, K. et al. (4 more authors) (2021) High-impact exercise stimulated localised adaptation of microarchitecture across distal tibia in postmenopausal women. Osteoporosis International, 32 (5). pp. 907-919. ISSN 0937-941X

Du, J. and Vanino, E. (2021) Agglomeration externalities of fast-growth firms. Regional Studies, 55 (2). pp. 167-181. ISSN 0034-3404

Du, J., Yu, F.R., Lu, G. et al. (3 more authors) (2020) MEC-assisted immersive VR video streaming over terahertz wireless networks: A deep reinforcement learning approach. IEEE Internet of Things, 7 (10). pp. 9517-9529. ISSN 2327-4662

Liu, D., Gu, D., Smyl, D. orcid.org/0000-0002-6730-5277 et al. (2 more authors) (2020) Shape reconstruction using Boolean operations in electrical impedance tomography. IEEE Transactions on Medical Imaging, 39 (9). pp. 2954-2964. ISSN 0278-0062

Feng, J., Yu, F.R., Pei, Q. et al. (3 more authors) (2020) Cooperative computation offloading and resource allocation for blockchain-enabled mobile edge computing: A deep reinforcement learning approach. IEEE Internet of Things Journal, 7 (7). pp. 6214-6228. ISSN 2327-4662

Liu, D., Gu, D., Smyl, D. orcid.org/0000-0002-6730-5277 et al. (2 more authors) (2020) B-spline level set method for shape reconstruction in electrical impedance tomography. IEEE Transactions on Medical Imaging, 39 (6). pp. 1917-1929. ISSN 0278-0062

Liu, D., Smyl, D. and Du, J. (2020) Nonstationary shape estimation in electrical impedance tomography using a parametric level set-based extended Kalman filter approach. IEEE Transactions on Instrumentation & Measurement, 69 (5). pp. 1894-1907. ISSN 0018-9456

Liu, D., Gu, D., Smyl, D. orcid.org/0000-0002-6730-5277 et al. (2 more authors) (2019) B-spline based sharp feature preserving shape reconstruction approach for electrical impedance tomography. IEEE Transactions on Medical Imaging, 38 (11). pp. 2533-2544. ISSN 0278-0062

Kaspar, T.C., Ryan, J.V., Pantano, C.G. et al. (15 more authors) (2019) Physical and optical properties of the International Simple Glass. npj Materials Degradation, 3 (1). 15. ISSN 2397-2106

Du, J., Brooke-Wavell, K., Paggiosi, M.A. orcid.org/0000-0002-1030-0723 et al. (4 more authors) (2019) Characterising variability and regional correlations of microstructure and mechanical competence of human tibial trabecular bone: An in-vivo HR-pQCT study. Bone, 121. pp. 139-148. ISSN 8756-3282

Du, J., Yu, F., Chu, X. orcid.org/0000-0003-1863-6149 et al. (2 more authors) (2019) Computation offloading and resource allocation in vehicular networks based on dual-side cost minimization. IEEE Transactions on Vehicular Technology, 68 (2). pp. 1079-1092. ISSN 0018-9545

Liu, D., Smyl, D. orcid.org/0000-0002-6730-5277 and Du, J. (2019) A parametric level set-based approach to difference imaging in electrical impedance tomography. IEEE Transactions on Medical Imaging, 38 (1). pp. 145-155. ISSN 0278-0062

Du, J., Zhao, L., Chu, X. orcid.org/0000-0003-1863-6149 et al. (3 more authors) (2018) Enabling low-latency applications in LTE-A based mixed fog/cloud computing systems. IEEE Transactions on Vehicular Technology, 68 (2). pp. 1757-1771. ISSN 0018-9545

Du, J., Zhao, L., Feng, J. et al. (1 more author) (2017) Computation Offloading and Resource Allocation in Mixed Fog/Cloud Computing Systems with Min-Max Fairness Guarantee. IEEE Transactions on Communications. ISSN 0090-6778

Willis, M., He, J., Du, J. et al. (5 more authors) (2017) Reply to “Comment on ‘Muon spin relaxation study of spin dynamics in poly(triarylamine)”’. Synthetic Metals, 234. pp. 177-179. ISSN 0379-6779

Gao, Y., You, B., Yang, H. L. et al. (11 more authors) (2016) Stochastic domain wall depinning in permalloy nanowires with various types of notches. RSC Advances. 125124. pp. 1-8. ISSN 2046-2069

Zhou, M., Allaire, G., Cheng, G. et al. (15 more authors) (2016) Special issue dedicated to Founding Editor George Rozvany. Structural and Multidisciplinary Optimization, 54 (5). pp. 1107-1111. ISSN 1615-147X

Gao, Y., Ruan, Xuezhong, You, B. et al. (6 more authors) (2016) Depinning of domain walls in permalloy nanowires with asymmetric notches. Scientific Reports. 32617. ISSN 2045-2322

He, J., Du, J., Kreouzis, T. et al. (6 more authors) (2015) Muon spin relaxation study of spin dynamics in poly(triarylamine). Synthetic Metals, 208. pp. 21-25. ISSN 0379-6779

Qiu, X.P, Yang, D.Z, Zhou, S.M et al. (6 more authors) (2008) Rotation of the pinning direction in the exchange bias training effect in polycrystalline NiFe/FeMn bilayers. Physical Review Letters. 147207. pp. 1-4. ISSN 1079-7114

Gao, T.R., Yang, D.Z., Zhou, S.M. et al. (4 more authors) (2007) Hysteretic behavior of angular dependence of exchange bias in FeNi/FeMn bilayers. Physical Review Letters. 057201. -. ISSN 1079-7114

Monograph

Du, J., Shepotylo, O. and Song, M. orcid.org/0000-0003-2375-6807 (2023) International Trade Challenges and the Effectiveness of Support Measures for the UK’s Creative Industries. Discussion Paper. Creative Industries Policy and Evidence Centre

Douch, M., Du, J. and Vanino, E. orcid.org/0000-0002-4740-1501 (2022) The heterogeneous effect of uncertainty on firms trade margins destruction and diversion. Working Paper. Sheffield Economic Research Paper Series, 2022002 (2022002). Department of Economics, University of Sheffield ISSN 1749-8368

Proceedings Paper

Hu, B. orcid.org/0000-0003-4821-0448, Du, J. and Chu, X. (2022) Enabling low-latency applications in vehicular networks based on mixed fog/cloud computing systems. In: 2022 IEEE Wireless Communications and Networking Conference (WCNC). IEEE Wireless Communications and Networking Conference (WCNC), 10-13 Apr 2022, Austin, TX, USA. Institute of Electrical and Electronics Engineers , pp. 722-727. ISBN 9781665442671