Items where authors include "Dargahi, T."
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Anih, J. orcid.org/0000-0002-0938-1036, Kolekar, S., Dargahi, T. orcid.org/0000-0002-0908-6483 et al. (3 more authors) (2023) Deriving Environmental Risk Profiles for Autonomous Vehicles From Simulated Trips. IEEE Access, 11. pp. 38385-38398. ISSN 2169-3536
Adeboye, O. orcid.org/0000-0002-6225-3383, Dargahi, T. orcid.org/0000-0002-0908-6483, Babaie, M. orcid.org/0000-0002-8480-940X et al. (2 more authors) (2022) DeepClean: A Robust Deep Learning Technique for Autonomous Vehicle Camera Data Privacy. IEEE Access, 10. pp. 124534-124544. ISSN 2169-3536
Belguith, S., Kaaniche, N. orcid.org/0000-0002-1045-6445, Hammoudeh, M. et al. (1 more author) (2020) PROUD : verifiable privacy-preserving outsourced attribute based signcryption supporting access policy update for cloud assisted IoT applications. Future Generation Computer Systems, 111. pp. 899-918. ISSN 0167-739X
Teing, Y.-Y., Dehghantanha, A., Choo, K.-K.R. et al. (2 more authors) (2017) Forensic investigation of cooperative storage cloud service: Symform as a case study. Journal of Forensic Sciences, 62 (3). pp. 641-654. ISSN 0022-1198
Book Section
Dargahi, T., Dehghantanha, A. and Conti, M. (2017) Forensics Analysis of Android Mobile VoIP Apps. In: Choo, K.-K.R. and Dehghantanha , A., (eds.) Contemporary Digital Forensic Investigations of Cloud and Mobile Applications. Elsevier , pp. 7-20. ISBN 9780128053034
Dargahi, T., Dehghantanha, A. and Conti, M. (2017) Investigating Storage as a Service Cloud Platform: pCloud as a Case Study. In: Choo, K.-K.R. and Dehghantanha, A., (eds.) Contemporary Digital Forensic Investigations of Cloud and Mobile Applications. Elsevier , pp. 185-204. ISBN 9780128053034
Proceedings Paper
Adeboye, O., Abdullahi, A., Dargahi, T. et al. (2 more authors) (2023) LIFT the AV: Location InFerence aTtack on Autonomous Vehicle Camera Data. In: Proceedings of 2023 IEEE 20th Consumer Communications & Networking Conference (CCNC). 2023 IEEE 20th Consumer Communications & Networking Conference (CCNC), 08-11 Jan 2023, Las Vegas, USA. IEEE . ISBN 978-1-6654-9735-0