Walther, T. and Wang, X. (2015) Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope. Journal of Microscopy. ISSN 1365-2818
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | Absorption correction; analytical TEM; InGaN; X-ray spectroscopy |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 28 Jan 2016 14:25 |
Last Modified: | 16 Nov 2016 13:38 |
Published Version: | https://dx.doi.org/10.1111/jmi.12291 |
Status: | Published |
Publisher: | Wiley |
Refereed: | Yes |
Identification Number: | 10.1111/jmi.12291 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:91475 |