Xu, H., Wu, Z., Liu, W. et al. (2 more authors) (2015) Analysis of the Effect of Interference on InSAR. IEEE Sensors Journal, 15 (10). 5659 - 5668. ISSN 1530-437X
Abstract
Various jamming techniques have been developed to prevent interferometric synthetic aperture radar from effective detection and observation. In this paper, a thorough analysis of the jamming effects on correlation and interferometric phase is provided. To derive the jamming result, a general signal model for the interference is first presented and the corresponding imaging results are produced through the range-Doppler algorithm. Then, the impacts of the interference on correlation are analyzed. The non-center located jammer decreases the correlation seriously due to the low correlation of the interference. However, the center located jammer clearly increases the correlation when the input jamming-to-signal ratio is large enough. Finally, the jammed interferometric phases for different jammer positions are discussed. It shows that the non-center located jammer results in large phase errors, while for the center located jammer, the interferometric phase approaches a constant. The effects of interference are demonstrated by simulated data based on the TerraSAR system.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 The Author(s). This is an Open Access article distributed under the terms of the Creative Commons Attribution Licence (http://creativecommons.org/licenses/by/3.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
Keywords: | SAR; interfereometry; interference; correlation; jamming to signal ratio |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 05 Oct 2015 15:35 |
Last Modified: | 05 Oct 2015 15:35 |
Published Version: | http://dx.doi.org/10.1109/JSEN.2015.2445931 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Refereed: | Yes |
Identification Number: | 10.1109/JSEN.2015.2445931 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:90491 |