Davidson, J., Stone, D., Foster, M. et al. (1 more author) (2015) Measurement and characterisation technique for real-time die temperature prediction of MOSFET-based power electronics. IEEE Transactions on Power Electronics. ISSN 1941-0107
Abstract
This paper presents a technique to predict the die temperature of a MOSFET based on an empirical model derived following an offline thermal characterization. First, a method for the near-simultaneous measurement of die temperature during controlled power dissipation is presented. The method uses a linear arbitrary waveform power controller which is momentarily disconnected at regular intervals to allow the forward voltage drop of the MOSFET's antiparallel diode to be measured. Careful timing ensures the power dissipation is not significantly affected by the repeated disconnection of the power controller. Second, a pseudorandom binary sequence-based system identification approach is used to determine the thermal transfer impedance, or cross coupling between the dice of two devices on shared cooling using the near-simultaneous measurement and control method. A set of infinite impulse response digital filters are fitted to the cross-coupling characteristics and used to form a temperature predictor. Experimental verification shows excellent agreement between measured and predicted temperature responses to power dissipation. Results confirm the usefulness of the technique for predicting die temperatures in real time without the need for on-die sensors.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 23 Sep 2015 15:12 |
Last Modified: | 21 Mar 2018 14:54 |
Published Version: | http://dx.doi.org/10.1109/TPEL.2015.2476557 |
Status: | Published |
Publisher: | IEEE |
Refereed: | Yes |
Identification Number: | 10.1109/TPEL.2015.2476557 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:90214 |