Liu, C. orcid.org/0000-0002-4910-4244, Chen, X. orcid.org/0000-0001-7448-9011, Zhang, Y. orcid.org/0009-0008-2596-2237 et al. (4 more authors) (2025) Three-dimensional semi-finite element based proximity loss calculation for Litz wires in a high frequency transformer. IEEE Transactions on Industry Applications, 61 (1). pp. 560-571. ISSN: 0093-9994
Abstract
Litz wires can be used to effectively reduce the skin effect loss while the proximity loss can be still significant considering the possible high flux densities produced by neighboring strands. This paper proposes a three-dimensional semi-finite element (semi-FE) based proximity loss calculation approach for Litz wires in a high frequency transformer. A set of analytical equations which are dedicated to the semi-FE approach for proximity loss calculations are derived. Compared to the existing semi-FE methods, the proposed method calculates proximity loss with volumetric factors in each element and hence can eliminate the error caused by the possible nonuniform mesh in winding regions. Experimental measurements show that compared to the conventional method, the proposed semi-FE method can predict closer proximity loss to measured results.
Metadata
| Item Type: | Article |
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| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | © 2025 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in IEEE Transactions on Industry Applications is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
| Keywords: | Engineering; Electrical Engineering |
| Dates: |
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| Institution: | The University of Sheffield |
| Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering |
| Date Deposited: | 17 Nov 2025 16:22 |
| Last Modified: | 17 Nov 2025 16:22 |
| Status: | Published |
| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
| Refereed: | Yes |
| Identification Number: | 10.1109/tia.2024.3481349 |
| Related URLs: | |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:234528 |
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Filename: Litz_wire_AC_loss - reference copy.pdf
Licence: CC-BY 4.0

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