Möbus, G., Levay, A., Inkson, B.J. orcid.org/0000-0002-2631-9090 et al. (3 more authors) (2022) Analysis of mismatched heterointerfaces by combined HREM image processing and modelling. International Journal of Materials Research, 94 (4). pp. 358-367. ISSN: 1862-5282
Abstract
Lattice mismatched heterointerfaces are classified by a simple five parameter configuration space which allows to quantify the following properties: gradual partial coherence, distribution and localisation of misfit dislocations, anisotropy of strain fields, elastic dissimilarity of the lattices. HREM images are digitally processed into one-dimensional strain and Fourier spectrum profiles along the interface at selected distance from the interface. The interpretation of these profiles as a Fourier expansion of displacement waves is justified through a link to continuum modelling approaches presented earlier. Limitations and microscope conditions for this simple direct image interpretation approach are listed and discussed.
Metadata
| Item Type: | Article |
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| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | © © 2003 Carl Hanser Verlag, München |
| Keywords: | Strain mapping; Misfit dislocations; Semiconductor interfaces; Intermetallic alloys; Dislocation networks; Molecular modelling; Quantitative HREM |
| Dates: |
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| Institution: | The University of Sheffield |
| Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > School of Chemical, Materials and Biological Engineering |
| Date Deposited: | 11 Nov 2025 11:41 |
| Last Modified: | 11 Nov 2025 11:41 |
| Status: | Published |
| Publisher: | Walter de Gruyter GmbH |
| Refereed: | Yes |
| Identification Number: | 10.1515/ijmr-2003-0066 |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:234310 |

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