Singh, A. orcid.org/0000-0003-4865-0320, Bag, S. and Gupta, S. (2025) Exploring the Effects of Merger and Acquisitions Activities on Employee Turnover Rate in High-Tech Firms. IEEE Transactions on Engineering Management. ISSN: 0018-9391
Abstract
In the high-tech industry, mergers and acquisitions (M&As) are widely used as a pathway to execute their strategic plans and maintain competitiveness in rapidly evolving markets. However, the integration of diverse corporate cultures during M&A deals can escalate employee dissatisfaction and contribute to increased turnover rates. There is an abundance of theoretical discourse in the literature concerning the implications of M&As for employee experiences; however, it falls short in providing robust empirical evidence for practitioners. We investigate the impact of M&A activities on employee turnover rates in high-tech firms to address this gap. Utilising longitudinal data from 1999 to 2023, we find that increased M&A activities in high-tech companies are associated with higher employee turnover. Our study also identifies that advertising and R&D expenditures, as well as the size of top management, diminish the contribution of M&A activities to employee turnover. Conversely, enhanced asset efficiency amplifies the contribution of M&A activities to employee turnover.
Metadata
| Item Type: | Article |
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| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | This is an author produced version of an article published in IEEE Transactions on Engineering Management made available under the terms of the Creative Commons Attribution License (CC-BY), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. |
| Keywords: | M&A; Employee Turnover; Firm-related Factors; High-tech |
| Dates: |
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| Institution: | The University of Leeds |
| Academic Units: | The University of Leeds > Faculty of Business (Leeds) > Marketing Division (LUBS) |
| Depositing User: | Symplectic Publications |
| Date Deposited: | 29 Jul 2025 16:24 |
| Last Modified: | 29 Jul 2025 16:24 |
| Status: | Published online |
| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
| Identification Number: | 10.1109/TEM.2025.3591556 |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:229744 |

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