Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust

Lévai, Z. and McMinn, P. orcid.org/0000-0001-9137-7433 (2023) Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust. In: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST). 16th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2023, 16-20 Apr 2023, Dublin, Ireland. Institute of Electrical and Electronics Engineers (IEEE), pp. 49-59. ISBN: 978-1-6654-5667-8. ISSN: 2159-4848.

Abstract

Metadata

Item Type: Proceedings Paper
Authors/Creators:
Copyright, Publisher and Additional Information:

© 2023 The Authors. Except as otherwise noted, this author-accepted version of a conference paper published in 2023 IEEE Conference on Software Testing, Verification and Validation (ICST) Proceedings is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Keywords: Software testing; Computer languages; Runtime; Codes; Memory management; Static analysis; Parallel processing
Dates:
  • Published (online): 26 May 2023
  • Published: 26 May 2023
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Date Deposited: 09 Aug 2024 11:59
Last Modified: 21 Jan 2026 15:47
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/icst57152.2023.00014
Related URLs:
Open Archives Initiative ID (OAI ID):

Export

Statistics