Sherriff, M. orcid.org/0000-0003-3212-6233, Griffo, A. orcid.org/0000-0001-5642-2921, Jia, C. et al. (3 more authors) (2025) Partial discharge in silicone gel on power module substrates in high-humidity conditions. IEEE Transactions on Dielectrics and Electrical Insulation, 32 (1). pp. 484-493. ISSN 1070-9878
Abstract
Partial discharge (PD) has been shown to affect quality of insulation in power electronics modules. This paper provides a comprehensive characterisation of PD activity in gel-encapsulated direct bonded copper (DBC) power module substrates when subjected to fast unipolar square excitations. PD characteristics in low and high humidity environments are compared. PD inception voltage (PDIV) testing and time-resolved PD (TRPD) analysis is performed to investigate discharges in each condition. Two PD groups were identified, categorised by their amplitude, and prompting further investigation of the weaker group with a statistics-based approach. The strong group did not vary with humidity and is attributed to discharges between the top and bottom copper of the DBC. The weaker group varied significantly with humidity and is attributed to discharges within the lateral trench gap of the DBC top copper.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2024 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in IEEE Transactions on Dielectrics and Electrical Insulation is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Humidity; Testing; Partial discharges; Substrates; Discharges (electric); Copper; Standards |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 11 Jun 2024 14:34 |
Last Modified: | 24 Feb 2025 15:43 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/tdei.2024.3404367 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:213384 |