EM-Fuzz: Augmented Firmware Fuzzing via Memory Checking

Gao, Jian, Xu, Yiwen, Jiang, Yu et al. (4 more authors) (Accepted: 2020) EM-Fuzz: Augmented Firmware Fuzzing via Memory Checking. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. (In Press)

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Item Type: Article
Authors/Creators:
Dates:
  • Accepted: 7 July 2020
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Computer Science (York)
Depositing User: Pure (York)
Date Deposited: 25 Aug 2020 09:20
Last Modified: 17 Sep 2025 02:07
Status: In Press
Refereed: Yes
Open Archives Initiative ID (OAI ID):

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