Tsuchiya, Tomoki, Kubota, Takahide, Sugiyama, Tomoko et al. (3 more authors) (2016) Exchange bias effects in Heusler alloy Ni2MnAl/Fe bilayers. Journal of Physics D: Applied Physics. 235001. ISSN 1361-6463
Abstract
Ni2MnAl Heusler alloy thin films were epitaxially grown on MgO(1 0 0) single crystal substrates by ultra-high-vacuum magnetron sputtering technique. X-ray diffraction and transmission electron microscopy observation revealed that the structures of all the Ni2MnAl thin films were B2-ordered regardless of the deposition temperature ranging from room temperature to 600 °C. The temperature dependence of electrical resistivity showed a kink about 280 K, which was consistent with a reported value of the Néel temperature for antiferromagnetic B2-Ni2MnAl. The magnetization curves of Ni2MnAl/Fe bilayer samples showed a shift caused by the interfacial exchange interaction at 10 K. The maximum value of the exchange bias field Hex was 55 Oe corresponding to the exchange coupling energy Jk of 0.03 erg cm−2.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016, IOP Publishing Ltd . This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details. |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) The University of York > Faculty of Sciences (York) > Physics (York) |
Funding Information: | Funder Grant number EUROPEAN COMMISSION UNSPECIFIED |
Depositing User: | Pure (York) |
Date Deposited: | 19 May 2016 11:21 |
Last Modified: | 26 Nov 2024 00:31 |
Published Version: | https://doi.org/10.1088/0022-3727/49/23/235001 |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1088/0022-3727/49/23/235001 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:99919 |
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