S'ari, M, Cattle, J, Hondow, N et al. (4 more authors) (2015) Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy. In: Journal of Physics: Conference Series. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE (EMAG2015), 30 Jun - 02 Jul 2015, Manchester, UK. IOP Publishing
Abstract
We have studied the impact of transmission electron microscopy (TEM) and low dose electron diffraction on ten different crystalline pharmaceutical compounds, covering a diverse chemical space and with differing physical properties. The aim was to establish if particular chemical moieties were more susceptible to damage within the electron beam. We have measured crystalline diffraction patterns for each and indexed nine out of ten of them. Characteristic electron dosages are reported for each material, with no apparent correlation between chemical structure and stability within the electron beam. Such low dose electron diffraction protocols are suitable for the study of pharmaceutical compounds.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015, The Authors. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 18 Jan 2016 09:59 |
Last Modified: | 18 Jan 2016 09:59 |
Published Version: | http://dx.doi.org/10.1088/1742-6596/644/1/012038 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/1742-6596/644/1/012038 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:93512 |