Chen, J, Marvin, A C orcid.org/0000-0003-2590-5335, Flintoft, Ian David orcid.org/0000-0003-3153-8447 et al. (1 more author) (2010) Double-Weibull distributions of the re-emission spectra from a non-linear device in a mode-stirred chamber. In: 2010 IEEE International Symposium on Electromagnetic Compatibility:18-23 July, 2010. IEEE , Fort Lauderdale, Florida, USA , pp. 541-546.
Abstract
A Double-Weibull distribution of the mean normalised field strength is used to formulate the statistical aspects of re-emission spectra in a reverberation chamber. Cumulative distributions of mean normalised measurement results are used to quantify the degrees of interaction between EUT and RF interference levels. This research is a precursor to digital device immunity diagnostic methodology on the statistics aspects independent from absolute magnitudes.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) |
Depositing User: | Pure (York) |
Date Deposited: | 07 Jun 2012 18:39 |
Last Modified: | 25 Jan 2025 00:02 |
Published Version: | https://doi.org/10.1109/ISEMC.2010.5711334 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/ISEMC.2010.5711334 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:69732 |
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Filename: Chen2010b.pdf
Description: Double-Weibull Distributions of the Re-Emission Spectra from a Non-Linear Device in a Mode Stirred Chamber