Impact of via placement on reflection coefficient in reflective metasurfaces

Yu, H. orcid.org/0009-0008-7329-8123, Saad, R. and Ball, E.A. orcid.org/0000-0002-6283-5949 (2025) Impact of via placement on reflection coefficient in reflective metasurfaces. In: 2025 19th European Conference on Antennas and Propagation (EuCAP). 2025 19th European Conference on Antennas and Propagation (EuCAP), 30 Mar - 04 Apr 2025, Stockholm, Sweden. Institute of Electrical and Electronics Engineers, pp. 1-4. ISBN: 9798350366327. ISSN: 2164-3342.

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Item Type: Proceedings Paper
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© 2025 The Authors. Except as otherwise noted, this author-accepted version of a proceedings paper published in 2025 19th European Conference on Antennas and Propagation (EuCAP) is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Keywords: Surface impedance; Phase measurement; PIN photodiodes; Resonant frequency; Prototypes; Europe; Metasurfaces; Reflection; Reflection coefficient; Impedance
Dates:
  • Published (online): 21 May 2025
  • Published: 21 May 2025
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering
The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
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Engineering and Physical Sciences Research Council
2887134
Date Deposited: 17 Feb 2026 12:22
Last Modified: 17 Feb 2026 12:22
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Refereed: Yes
Identification Number: 10.23919/eucap63536.2025.10999905
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