Analysis of mismatched heterointerfaces by combined HREM image processing and modelling

Möbus, G., Levay, A., Inkson, B.J. orcid.org/0000-0002-2631-9090 et al. (3 more authors) (2022) Analysis of mismatched heterointerfaces by combined HREM image processing and modelling. International Journal of Materials Research, 94 (4). pp. 358-367. ISSN: 1862-5282

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Item Type: Article
Authors/Creators:
Copyright, Publisher and Additional Information:

© © 2003 Carl Hanser Verlag, München

Keywords: Strain mapping; Misfit dislocations; Semiconductor interfaces; Intermetallic alloys; Dislocation networks; Molecular modelling; Quantitative HREM
Dates:
  • Published (online): 3 February 2022
  • Published: 3 February 2022
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Chemical, Materials and Biological Engineering
Date Deposited: 11 Nov 2025 11:41
Last Modified: 11 Nov 2025 11:41
Status: Published
Publisher: Walter de Gruyter GmbH
Refereed: Yes
Identification Number: 10.1515/ijmr-2003-0066
Open Archives Initiative ID (OAI ID):

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