High risk regional load attacks in smart grids

Du, M. orcid.org/0009-0009-9806-841X, Zhang, X. orcid.org/0000-0002-6063-959X and Zhao, J. orcid.org/0000-0002-8498-9666 (2025) High risk regional load attacks in smart grids. IEEE Internet of Things Journal. ISSN 2327-4662

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Item Type: Article
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© 2025 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in IEEE Internet of Things Journal is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Keywords: Smart grids; deviation of corrupted data; line overloads; regional load attacks; high risk
Dates:
  • Published (online): 25 April 2025
  • Published: 25 April 2025
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering
Depositing User: Symplectic Sheffield
Date Deposited: 14 May 2025 08:16
Last Modified: 14 May 2025 08:17
Status: Published online
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/jiot.2025.3564490
Open Archives Initiative ID (OAI ID):

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