Du, M. orcid.org/0009-0009-9806-841X, Zhang, X. orcid.org/0000-0002-6063-959X and Zhao, J. orcid.org/0000-0002-8498-9666 (2025) High risk regional load attacks in smart grids. IEEE Internet of Things Journal. ISSN 2327-4662
Abstract
This letter develops a high-risk regional load attack mechanism in smart grids with incomplete network information. Different from previous research, this attack mechanism enables an attacker to launch a regional load attack with network information about an arbitrary attack region, while minimising the deviation in corrupted data to enhance the stealth of this attack. Such an attack only corrupts a limited number of loads while still overloading multiple lines within a targeted attack region, resulting in significant impacts on smart grids. Case studies conducted on two modified IEEE test systems validate the effectiveness of our proposed attack mechanism and pave the foundation for the future development of practical defensive strategies.
Metadata
Item Type: | Article |
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Authors/Creators: | |
Copyright, Publisher and Additional Information: | © 2025 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in IEEE Internet of Things Journal is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Smart grids; deviation of corrupted data; line overloads; regional load attacks; high risk |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 14 May 2025 08:16 |
Last Modified: | 14 May 2025 08:17 |
Status: | Published online |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/jiot.2025.3564490 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:226634 |
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Filename: (Final-Paper-2025-04-23-IOTJ)-High Risk Regional Load Attacks in Smart Grid.pdf
Licence: CC-BY 4.0