Can test generation and program repair inform automated assessment of programming projects?

Gu, R., Rojas, J.M. and Shin, D. orcid.org/0000-0002-0840-6449 (Accepted: 2024) Can test generation and program repair inform automated assessment of programming projects? In: 2025 IEEE Conference on Software Testing, Verification and Validation (ICST). 18th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2025, 31 Mar - 04 Apr 2025, Naples, Italy. Institute of Electrical and Electronics Engineers (IEEE) (In Press)

Abstract

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Item Type: Proceedings Paper
Authors/Creators:
Copyright, Publisher and Additional Information:

© 2025 The Author(s).

Keywords: Automated Assessment; Test Generation; Program Repair
Dates:
  • Accepted: 9 December 2024
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 21 Feb 2025 10:21
Last Modified: 21 Feb 2025 10:22
Status: In Press
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Related URLs:
Open Archives Initiative ID (OAI ID):

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