Can test generation and program repair inform automated assessment of programming projects?

Gu, R., Rojas, J.M. and Shin, D. orcid.org/0000-0002-0840-6449 (2025) Can test generation and program repair inform automated assessment of programming projects? In: 2025 IEEE Conference on Software Testing, Verification and Validation (ICST). 18th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2025, 31 Mar - 04 Apr 2025, Naples, Italy. Institute of Electrical and Electronics Engineers (IEEE) , pp. 699-710. ISBN 979-8-3315-0815-9

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Item Type: Proceedings Paper
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© 2025 The Author(s). The Authors. Except as otherwise noted, this author-accepted version of a paper published in 2025 IEEE Conference on Software Testing, Verification and Validation (ICST) is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Keywords: Automated Assessment; Test Generation; Program Repair
Dates:
  • Accepted: 9 December 2024
  • Published (online): 20 May 2025
  • Published: 20 May 2025
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 21 Feb 2025 10:21
Last Modified: 29 May 2025 14:56
Status: Published online
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/ICST62969.2025.10988955
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