Effect of Defects on the Characteristics of CoFeB–MgO-Based MRAM Structure

Magnetic random-access memory (MRAM) is one of the most promising next-generation purpose memory devices for nonvolatile storage and in-memory computing. However, material defects can affect the performance of the MRAM device. Here, the relationship between the material defects and the properties of CoFeB–MgO-based MRAM have been studied with micromagnetic simulations. The results show that the coercivity and the switching speed are strongly influenced by the material defects. This work provides a useful guideline for the fabrication of the MARM devices.