Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust

Lévai, Z. and McMinn, P. orcid.org/0000-0001-9137-7433 (2023) Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust. In: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST). 16th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2023, 16-20 Apr 2023, Dublin, Ireland. Institute of Electrical and Electronics Engineers (IEEE) , pp. 49-59. ISBN 978-1-6654-5667-8

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Item Type: Proceedings Paper
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© 2023 IEEE

Keywords: Software testing; Computer languages; Runtime; Codes; Memory management; Static analysis; Parallel processing
Dates:
  • Published: 26 May 2023
  • Published (online): 26 May 2023
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 09 Aug 2024 11:59
Last Modified: 09 Aug 2024 11:59
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/icst57152.2023.00014
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