Structural and dielectric properties of CaSnO3-doped Sr2.1Na0.8Nb5O15 ceramics

The crystallographic, microstructural, and dielectric properties of Sr2.1Na0.8-xCaxNb5-xSnxO15 (x = 0.00, 0.01, 0.05, 0.10) polycrystalline ceramics have been studied by X-ray diffraction, scanning electron microscopy, dielectric spectroscopy (DS) and impedance spectroscopy (IS). For x = 0.00, 0.05, and 0.10, samples are single phase with P4bm symmetry at room temperature with x = 0.01 showing a small quantity of secondary phase(s). All compositions show typical ceramic microstructures and d50 grain sizes ranging from 5.1 to 26.6 μm. DS shows a clear trend in the high temperature ferroelectric-paraelectric transition with the Curie temperature, T0, decreasing from ∼ 160 to ∼ 110 °C, and an additional relaxation at approximately 120 °C with increasing CaSnO3. IS reveals all samples have a homogeneous electrical microstructure with predominantly electronic conduction. The activation energy of conduction calculated from Arrhenius plots of the conductivity increases with CaSnO3 content from 1.27 to 1.38 eV likely due to the expansion of the band gap.