Automated Scanning Probe Tip State Classification without Machine Learning

Barker, D.S. orcid.org/0000-0001-5272-6266, Blowey, P.J. orcid.org/0000-0003-0357-5355, Brown, T. et al. (1 more author) (2024) Automated Scanning Probe Tip State Classification without Machine Learning. ACS Nano, 18 (3). pp. 2384-2394. ISSN 1936-0851

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Item Type: Article
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Copyright © 2024 The Authors. Published by American Chemical Society. This publication is licensed under CC-BY 4.0.

Keywords: atomic resolution; automation; cross-correlation; in situ tip conditioning; machine learning; scanning probe microscopy (SPM); scanning tunneling microscopy (STM)
Dates:
  • Published: 23 January 2024
  • Published (online): 9 January 2024
  • Accepted: 2 January 2024
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Physics and Astronomy (Leeds) > Molecular & Nanoscale Physics
Depositing User: Symplectic Publications
Date Deposited: 23 Aug 2024 14:41
Last Modified: 23 Aug 2024 14:41
Published Version: http://dx.doi.org/10.1021/acsnano.3c10597
Status: Published
Publisher: American Chemical Society (ACS)
Identification Number: 10.1021/acsnano.3c10597
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