Verma, A.K. orcid.org/0000-0002-8719-4869, Ahmed, H. orcid.org/0000-0001-8952-4190, Burgos-Mellado, C. orcid.org/0000-0003-1990-0191 et al. (2 more authors) (2023) Enhanced two consecutive samples based de-modulation technique for atomic force microscopy application. Measurement, 223. 113731. ISSN 0263-2241
Abstract
This article investigates robust amplitude detectors suitable for atomic force microscopy (AFM) while discussing better alternatives. An AFM instrument’s measurement unit is responsible for providing the amplitude information obtained from the tip of a cantilever beam to identify the surface smoothness of a test material. Therefore, two efficient approaches are suggested to leverage Lyapunov’s theory while adhering to better noise suppression and DC-offset rejection capabilities. Nevertheless, an enhanced two samples-based Lyapunov’s demodulation approach is proposed to detect the amplitude information rapidly. Consequently, the modifications applied to the conventional method help reduce the tuning efforts and structural complications. The proposed solution remains structurally simpler and useful for high- and low-frequency probes. Furthermore, the extensive design guidelines for all techniques and the simulation results are presented. Different amplitude signals are synthetically generated from several rough pseudo-test surfaces for early verification and sent to a real-time digital controller to judge the proposal’s efficacy.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2023 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in Measurement is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Amplitude estimation; Atomic force microscopy; Delayed signal cancellation operators; Lyapunov’s de-modulator; Moving average filter (MAF) |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Advanced Manufacturing Institute (Sheffield) > Nuclear Advanced Manufacturing Research Centre |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 26 Oct 2023 14:01 |
Last Modified: | 26 Oct 2023 14:01 |
Status: | Published |
Publisher: | Elsevier BV |
Refereed: | Yes |
Identification Number: | 10.1016/j.measurement.2023.113731 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:204629 |