Ben Rached, N, Kammoun, A, Alouini, M-S et al. (1 more author) (2020) An Accurate Sample Rejection Estimator of the Outage Probability With Equal Gain Combining. IEEE Open Journal of the Communications Society, 1. pp. 1022-1034. ISSN 2644-125X
Abstract
We evaluate the outage probability (OP) for L-branch equal gain combining (EGC) receivers operating over fading channels, i.e., equivalently the cumulative distribution function (CDF) of the sum of the L channel envelopes. In general, closed form expressions of OP values are out of reach. The use of Monte Carlo (MC) simulations is not a good alternative as it requires a large number of samples for small values of OP. In this paper, we use the concept of importance sampling (IS), being known to yield accurate estimates using fewer simulation runs. Our proposed IS scheme is based on sample rejection where the IS density is the truncation of the underlying density over the L dimensional sphere. It assumes the knowledge of the CDF of the sum of the L channel gains in closed-form. Such an assumption is not restrictive since it holds for various challenging fading models. We apply our approach to the case of independent Rayleigh, correlated Rayleigh, and independent and identically distributed Rice fading models. Next, we extend our approach to the interesting scenario of generalised selection combining receivers combined with EGC under the independent Rayleigh environment. For each case, we prove the desired bounded relative error property. Finally, we validate these theoretical results through some selected experiments.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | This is protected by copyright. All rights reserved. This is an open access article under the terms of the Creative Commons Attribution 4.0 International (CC BY 4.0) |
Keywords: | Outage probability, equal gain combining, importance sampling, sample rejection, generalised selection combining, bounded relative error |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Mathematics (Leeds) > Statistics (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 09 Nov 2022 16:39 |
Last Modified: | 09 Nov 2022 16:39 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Identification Number: | 10.1109/ojcoms.2020.3010649 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:192947 |