Rezaei Jegarluei, M orcid.org/0000-0002-6770-7161, El-Gorashi, T, Elmirghani, JMH et al. (1 more author) (2022) A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors. IEEE Transactions on Power Delivery, 37 (6). pp. 5484-5487. ISSN 0885-8977
Abstract
Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance using the weighted least-squares method. The main contribution of the letter is the rigorous derivation of the equation weights based on the statistical distributions of the superimposed errors, i.e., the differences between the errors of the corresponding pre- and post-fault synchrophasors. The method's effectiveness, robustness against different factors, and superiority over existing methods are demonstrated by extensive simulations and comparison studies conducted on the IEEE 39-bus test system.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
Keywords: | Wide-area fault location (WAFL) , measurement error , superimposed circuit , synchrophasors |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Communication & Power Networks (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 14 Oct 2022 15:22 |
Last Modified: | 28 Jan 2023 01:22 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/TPWRD.2022.3214746 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:191805 |