Ilett, M, S'ari, M, Freeman, H orcid.org/0000-0001-8242-9561 et al. (10 more authors) (2020) Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 378 (2186). 20190601. 20190601-. ISSN 1364-503X
Abstract
We review the use of transmission electron microscopy (TEM) and associated techniques for the analysis of beam-sensitive materials and complex, multiphase systems in-situ or close to their native state. We focus on materials prone to damage by radiolysis and explain that this process cannot be eliminated or switched off, requiring TEM analysis to be done within a dose budget to achieve an optimum dose-limited resolution. We highlight the importance of determining the damage sensitivity of a particular system in terms of characteristic changes that occur on irradiation under both an electron fluence and flux by presenting results from a series of molecular crystals. We discuss the choice of electron beam accelerating voltage and detectors for optimizing resolution and outline the different strategies employed for low-dose microscopy in relation to the damage processes in operation. In particular, we discuss the use of scanning TEM (STEM) techniques for maximizing information content from high-resolution imaging and spectroscopy of minerals and molecular crystals. We suggest how this understanding can then be carried forward for in-situ analysis of samples interacting with liquids and gases, provided any electron beam-induced alteration of a specimen is controlled or used to drive a chosen reaction. Finally, we demonstrate that cryo-TEM of nanoparticle samples snap-frozen in vitreous ice can play a significant role in benchmarking dynamic processes at higher resolution.
This article is part of a discussion meeting issue ‘Dynamic in situ microscopy relating structure and function’.
Metadata
Item Type: | Article |
---|---|
Authors/Creators: |
|
Copyright, Publisher and Additional Information: | © 2020 The Author(s). This is an author produced version of an article published in Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. Uploaded in accordance with the publisher's self-archiving policy. |
Keywords: | STEM; radiolysis; beam-sensitive materials; TEM |
Dates: |
|
Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) The University of Leeds > Faculty of Environment (Leeds) > School of Food Science and Nutrition (Leeds) > FSN Colloids and Food Processing (Leeds) |
Funding Information: | Funder Grant number EPSRC (Engineering and Physical Sciences Research Council) EP/M028143/1 EPSRC (Engineering and Physical Sciences Research Council) EP/P00122X/1 |
Depositing User: | Symplectic Publications |
Date Deposited: | 10 Nov 2020 15:55 |
Last Modified: | 25 Jun 2023 22:29 |
Status: | Published online |
Publisher: | The Royal Society |
Identification Number: | 10.1098/rsta.2019.0601 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:167775 |