Gao, Jian, Xu, Yiwen, Jiang, Yu et al. (4 more authors) (Accepted: 2020) EM-Fuzz: Augmented Firmware Fuzzing via Memory Checking. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. (In Press)
Metadata
Item Type: | Article |
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Authors/Creators: |
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Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Computer Science (York) |
Depositing User: | Pure (York) |
Date Deposited: | 25 Aug 2020 09:20 |
Last Modified: | 22 Jan 2025 00:15 |
Status: | In Press |
Refereed: | Yes |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:164791 |