Hage, FS, Radtke, G, Kepaptsoglou, DM et al. (2 more authors) (2020) Single-atom vibrational spectroscopy in the scanning transmission electron microscope. Science, 367 (6482). pp. 1124-1127. ISSN 0036-8075
Abstract
Single-atom impurities and other atomic-scale defects can notably alter the local vibrational responses of solids and, ultimately, their macroscopic properties. Using high-resolution electron energy-loss spectroscopy in the electron microscope, we show that a single substitutional silicon impurity in graphene induces a characteristic, localized modification of the vibrational response. Extensive ab initio calculations reveal that the measured spectroscopic signature arises from defect-induced pseudo-localized phonon modes—that is, resonant states resulting from the hybridization of the defect modes and the bulk continuum—with energies that can be directly matched to the experiments. This finding realizes the promise of vibrational spectroscopy in the electron microscope with single-atom sensitivity and has broad implications across the fields of physics, chemistry, and materials science.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | Copyright © 2020 The Authors. This is the author’s version of the work. It is posted here by permission of the AAAS for personal use, not for redistribution. The definitive version was published in Science, Vol. 367 , 06 Mar 2020, DOI: 10.1126/science.aba1136 |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 31 Mar 2020 11:21 |
Last Modified: | 31 Mar 2020 11:33 |
Status: | Published |
Publisher: | American Association for the Advancement of Science |
Identification Number: | 10.1126/science.aba1136 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:158846 |