Aldridge, M orcid.org/0000-0002-9347-1586, Baldassini, L and Johnson, O (2014) Group Testing Algorithms: Bounds and Simulations. IEEE Transactions on Information Theory, 60 (6). pp. 3671-3687. ISSN 0018-9448
Abstract
We consider the problem of nonadaptive noiseless group testing of N items of which K are defective. We describe four detection algorithms, the COMP algorithm of Chan et al., two new algorithms, DD and SCOMP, which require stronger evidence to declare an item defective, and an essentially optimal but computationally difficult algorithm called SSS. We consider an important class of designs for the group testing problem, namely those in which the test structure is given via a Bernoulli random process. In this class of Bernoulli designs, by considering the asymptotic rate of these algorithms, we show that DD outperforms COMP, that DD is essentially optimal in regimes where K ≥ √N, and that no algorithm can perform as well as the best nonrandom adaptive algorithms when K > N 0.35 . In simulations, we see that DD and SCOMP far outperform COMP, with SCOMP very close to the optimal SSS, especially in cases with larger K.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2014, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
Keywords: | Algorithm design and analysis; group testing; sparse models |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Mathematics (Leeds) > Statistics (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 26 Jun 2019 13:42 |
Last Modified: | 27 Jun 2019 21:34 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/TIT.2014.2314472 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:147161 |