Yu, Chris Nga Tung, Vick, Andrew James, Inami, Nobuhito et al. (3 more authors) (2017) Exchange bias induced at a Co2FeAl0.5Si0.5/Cr interface. Journal of Physics D: Applied Physics. 125004. pp. 1-6. ISSN 1361-6463
Abstract
In order to engineer the strength of an exchange bias in a cubic Heusler alloy layer, crystalline strain has been induced at a ferromagnet/antiferromagnet interface by their lattice mismatch in addition to the conventional interfacial exchange coupling between them. Such interfaces have been formed in (Co2FeAl0.5Si0.5(CFAS)/Cr)3 structures grown by ultrahigh vacuum molecular beam epitaxy. The magnetic and structural properties have been characterised to investigate the exchange interactions at the CFAS/Cr interfaces. Due to the interfacial lattice mismatch of 1.4%, the maximum offset of 18 Oe in a magnetisation curve has been measured for the case of a CFAS (2 nm)/Cr (0.9 nm) interface at 193 K. The half-metallic property of CFAS has been observed to remain unchanged, which agrees with the theoretical prediction by Culbert et al (2008 J. Appl. Phys. 103 07D707). Such a strain-induced exchange bias may provide insight of the interfacial interactions and may offer a wide flexibility in spintronic device design.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2017 The Author(s). |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) |
Depositing User: | Pure (York) |
Date Deposited: | 12 Apr 2017 16:00 |
Last Modified: | 13 Mar 2025 05:23 |
Published Version: | https://doi.org/10.1088/1361-6463/aa560d |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1088/1361-6463/aa560d |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:115030 |