A Detailed Investigation into Low-Level Feature Detection in Spectrogram Images

Lampert, Thomas and O'Keefe, Simon orcid.org/0000-0001-5957-2474 (2011) A Detailed Investigation into Low-Level Feature Detection in Spectrogram Images. Pattern recognition. pp. 2076-2092. ISSN 0031-3203

Abstract

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Authors/Creators:
Keywords: Spectrogram,Low-Level,Periodic Time Series,Remote Sensing,Line Detection,Feature Detection,Software,Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing
Dates:
  • Published: September 2011
  • Published (online): 20 February 2011
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Computer Science (York)
Depositing User: Pure (York)
Date Deposited: 23 May 2013 23:19
Last Modified: 22 Aug 2021 10:20
Published Version: https://doi.org/10.1016/j.patcog.2011.02.014
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.patcog.2011.02.014
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