Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays

Hu, Z. orcid.org/0000-0001-7306-883X, Zhang, Y., Li, P. et al. (2 more authors) (2023) Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays. Optics Express, 31 (10). p. 15791. ISSN 1094-4087

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Copyright, Publisher and Additional Information: © 2023. Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. (https://creativecommons.org/licenses/by/4.0/) Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
Keywords: Quantum Physics; Physical Sciences; Bioengineering
Dates:
  • Accepted: 11 April 2023
  • Published (online): 26 April 2023
  • Published: 8 May 2023
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 31 Jan 2024 10:28
Last Modified: 31 Jan 2024 10:28
Status: Published
Publisher: Optica Publishing Group
Refereed: Yes
Identification Number: https://doi.org/10.1364/oe.487002
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