A theoretical framework for understanding mutation-based testing methods

Shin, D. orcid.org/0000-0002-0840-6449 and Bae, D.-H. (2016) A theoretical framework for understanding mutation-based testing methods. In: 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST). 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST), 11-15 Apr 2016, Chicago, IL, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 299-308. ISBN 9781509018260

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Keywords: Theoretical framework; mutation-based testing
Dates:
  • Published (online): 21 July 2016
  • Published: 21 July 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 22 Sep 2023 08:38
Last Modified: 22 Sep 2023 08:38
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: https://doi.org/10.1109/icst.2016.22
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