On the Efficient Simulation of Outage Probability in a Log-Normal Fading Environment

Ben Rached, N, Kammoun, A, Alouini, M-S et al. (1 more author) (2017) On the Efficient Simulation of Outage Probability in a Log-Normal Fading Environment. IEEE Transactions on Communications, 65 (6). pp. 2583-2593. ISSN 0090-6778

Abstract

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Authors/Creators:
  • Ben Rached, N
  • Kammoun, A
  • Alouini, M-S
  • Tempone, R
Copyright, Publisher and Additional Information: © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Keywords: covariance matrix scaling; importance sampling; mean shifting; Outage probability; sum of correlated log-normal
Dates:
  • Accepted: 4 February 2017
  • Published (online): 15 February 2017
  • Published: June 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Mathematics (Leeds) > Statistics (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 27 Nov 2023 15:50
Last Modified: 27 Nov 2023 15:50
Published Version: http://dx.doi.org/10.1109/tcomm.2017.2669979
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/tcomm.2017.2669979

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