Using multiple feature spaces-based deep learning for tool condition monitoring in ultra-precision manufacturing

Shi, C., Panoutsos, G., Luo, B. et al. (3 more authors) (2019) Using multiple feature spaces-based deep learning for tool condition monitoring in ultra-precision manufacturing. IEEE Transactions on Industrial Electronics, 66 (5). pp. 3794-3803. ISSN 0278-0046

Abstract

Metadata

Authors/Creators:
  • Shi, C.
  • Panoutsos, G.
  • Luo, B.
  • Liu, H.
  • Li, B.
  • Lin, X.
Copyright, Publisher and Additional Information: © 2018 IEEE. This is an author produced version of a paper subsequently published in IEEE Transactions on Industrial Electronics. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Accepted: 20 June 2018
  • Published (online): 26 July 2018
  • Published: May 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Automatic Control and Systems Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 06 Jul 2018 14:13
Last Modified: 07 Aug 2020 12:36
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Refereed: Yes
Identification Number: https://doi.org/10.1109/TIE.2018.2856193

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