On the Dynamic characteristics of Ferroelectric and Paraelectric FETs

Kumar, A. orcid.org/0000-0002-8288-6401 and De Souza, M.M. (2018) On the Dynamic characteristics of Ferroelectric and Paraelectric FETs. In: 2018 IEEE Electron Devices Technology and Manufacturing Conference Proceedings of Technical Papers. 2018 IEEE Electron Devices Technology and Manufacturing Conference (EDTM), 13-16 Mar 2018, Kobe, Japan. IEEE Electron Devices Society , pp. 184-185. ISBN 978-1-5386-3711-1

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Keywords: Paraelectric FET; gate scan frequency; steep subthreshold switching; ferroelectric FET; series R-C circuit
Dates:
  • Published: 31 July 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Funding Information:
FunderGrant number
ENIAC296131-1
Depositing User: Symplectic Sheffield
Date Deposited: 19 Apr 2018 08:53
Last Modified: 04 Sep 2018 14:16
Published Version: https://doi.org/10.1109/EDTM.2018.8421493
Status: Published
Publisher: IEEE Electron Devices Society
Refereed: Yes
Identification Number: https://doi.org/10.1109/EDTM.2018.8421493

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