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El-Gomati, M., Zaggout, F., Jayacody, H. et al. (2 more authors) (2005) Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update M. El-Gomati F. Zaggout H. Jayacody S. Tear K. Wilson. Surface and Interface Analysis, 37 (11). pp. 901-911. ISSN 0142-2421

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