Items where authors include "Xing, W.W."
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Shah, A.A. orcid.org/0000-0003-3745-2636, Leung, P.K. and Xing, W.W. orcid.org/0000-0002-3177-8478 (2025) Rapid high-fidelity quantum simulations using multi-step nonlinear autoregression and graph embeddings. npj Computational Materials, 11 (1). 57. ISSN 2057-3960
Xing, W.W. orcid.org/0000-0002-3177-8478, Shah, A.A., Shah, N. et al. (6 more authors) (2023) Data-driven prediction of Li-ion battery degradation using predicted features. Processes, 11 (3). 678. ISSN 2227-9717
Proceedings Paper
Xing, W.W., Chen, H., Chen, Z. et al. (5 more authors) (2025) Adaptive LCI data completion: Integrating neural processes and active learning for enhanced life cycle assessment. In: Mativenga, P. and Gallego-Schmid, A., (eds.) Procedia CIRP. 32nd CIRP Conference on Life Cycle Engineering (LCE 2025), 07-09 Apr 2025, Manchester, United Kingdom. Elsevier , pp. 136-141.
Xing, W.W. orcid.org/0000-0002-3177-8478, Fan, W. orcid.org/0009-0006-4522-2194, Liu, Z. orcid.org/0009-0001-2415-793X et al. (2 more authors) (2024) KATO: Knowledge alignment and transfer for transistor sizing of different design and technology. In: DAC '24: Proceedings of the 61st ACM/IEEE Design Automation Conference. DAC '24: 61st ACM/IEEE Design Automation Conference, 23-27 Jun 2024, San Francisco CA, USA. ACM , pp. 1-6. ISBN 9798400706011
Liu, Y. orcid.org/0009-0001-6499-3705, He, L. orcid.org/0000-0002-5266-3805 and Xing, W.W. orcid.org/0000-0002-3177-8478 (2024) Beyond the yield barrier: Variational importance sampling yield analysis. In: Xiong, J. and Wille, R., (eds.) Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design. ICCAD '24: 43rd IEEE/ACM International Conference on Computer-Aided Design. ACM , p. 36. ISBN 9798400710773
Sun, J. orcid.org/0009-0007-0540-7482, Zha, X. orcid.org/0000-0002-4616-2334, Wang, C. orcid.org/0009-0000-1248-889X et al. (4 more authors) (2024) Pseudo adjoint optimization: harnessing the solution curve for SPICE acceleration. In: Xiong, J. and Wille, R., (eds.) ICCAD '24: Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design. ICCAD '24: 43rd IEEE/ACM International Conference on Computer-Aided Design, 27-31 Oct 2024, New York, USA. ACM . ISBN 9798400710773