Items where authors include "Wohlfahrt, M."

Article

Wohlfahrt, M., Uren, M.J., Yin, Y. et al. (2 more authors) (2021) Vertical field inhomogeneity associated with threading dislocations in GaN high electron mobility transistor epitaxial stacks. Applied Physics Letters, 119 (24). 243502. ISSN 0003-6951