Items where authors include "Sun, Mingling"

Article

Jackson, Edward Alan, Wu, Yifan, Frost, William James orcid.org/0000-0001-5249-1006 et al. (9 more authors) (2019) Non-destructive imaging for quality assurance of magnetoresistive random-access memory junctions. Journal of Physics D: Applied Physics. 014004. ISSN 1361-6463

Jackson, Edward Alan, Sun, Mingling, Kubota, Takahide et al. (2 more authors) (2018) Chemical and structural analysis on magnetic tunnel junctions using a decelerated scanning electron beam. Scientific Reports. 7585. ISSN 2045-2322