Items where authors include "Silva, A.C.D."

Article

Sánchez-Arriaga, N.E. orcid.org/0000-0002-3251-4116, Silva, A.C.D. orcid.org/0000-0002-6258-9506, Tiwari, D. orcid.org/0000-0003-4546-5031 et al. (3 more authors) (2025) The development of a miniaturised spectroscopic reflectance system for thin-film multilayer thickness measurements. IEEE Transactions on Instrumentation and Measurement. ISSN 0018-9456