Items where authors include "Sánchez-Arriaga, N.E."

Article

Sánchez-Arriaga, N.E. orcid.org/0000-0002-3251-4116, Silva, A.C.D. orcid.org/0000-0002-6258-9506, Tiwari, D. orcid.org/0000-0003-4546-5031 et al. (3 more authors) (2025) The development of a miniaturised spectroscopic reflectance system for thin-film multilayer thickness measurements. IEEE Transactions on Instrumentation and Measurement. ISSN 0018-9456

Sánchez-Arriaga, N.E., Canzini, E., Espley-Plumb, N.J. et al. (4 more authors) (2025) Enhancing thin-film wafer inspection with a multi-sensor array and robot constraint maintenance. Scientific Reports, 15 (1). 39654. ISSN 2045-2322

Sánchez-Arriaga, N.E. orcid.org/0000-0002-3251-4116, Tiwari, D., Hutabarat, W. orcid.org/0000-0001-7393-7695 et al. (2 more authors) (2023) A spectroscopic reflectance-based low-cost thickness measurement system for thin films: development and testing. Sensors, 23 (11). 5326. ISSN 1424-8220