Items where authors include "Sánchez-Arriaga, N.E."

Article

Sánchez-Arriaga, N.E. orcid.org/0000-0002-3251-4116, Tiwari, D., Hutabarat, W. orcid.org/0000-0001-7393-7695 et al. (2 more authors) (2023) A spectroscopic reflectance-based low-cost thickness measurement system for thin films: development and testing. Sensors, 23 (11). 5326. ISSN 1424-8220