Items where authors include "Pavelescu, E.M."

Article

Walther, T. orcid.org/0000-0003-3571-6263, Nutter, J., Reithmaier, J.P. et al. (1 more author) (2020) X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium. Semiconductor Science and Technology, 35 (8). 084001. ISSN 0268-1242