Items where authors include "Parry, O."

Article

Parry, O. orcid.org/0000-0002-0917-1274, Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2023) Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models. Empirical Software Engineering, 28. 72. ISSN 1382-3256

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) A survey of flaky tests. ACM Transactions on Software Engineering and Methodology, 31 (1). 17. ISSN 1049-331X

Proceedings Paper

Gruber, M., Roslan, M.F., Parry, O. et al. (3 more authors) (2024) Do automatic test generation tools generate flaky tests? In: ICSE '24: Proceedings of the 46th IEEE/ACM International Conference on Software Engineering. 46th International Conference on Software Engineering (ICSE 2024), 14-20 Apr 2024, Lisbon, Portugal. Association for Computing Machinery (ACM) , New York, NY, United States . ISBN 9798400702174

Threlfall, E. J., Akers, R. J., Arter, W. et al. (31 more authors) (2023) Software for Fusion Reactor Design: ExCALIBUR Project NEPTUNE:Towards Exascale Plasma Edge Simulations. In: 29th IAEA Fusion Energy Conference, proceedings. 29th IAEA Fusion Energy Conference, 16-21 Oct 2023. , GBR .

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Surveying the developer experience of flaky tests. In: ICSE-SEIP '22: Proceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice. ICSE '22: 44th International Conference on Software Engineering, 21-29 May 2022, Pennsylvania, Pittsburgh. Association for Computing Machinery (ACM) , pp. 253-262. ISBN 9781450392266

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Evaluating features for machine learning detection of order- and non-order-dependent flaky tests. In: Proceedings of 2022 IEEE Conference on Software Testing, Verification and Validation (ICST). 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 04-14 Apr 2022, Valencia, Spain. Institute of Electrical and Electronics Engineers (IEEE) , pp. 93-104. ISBN 9781665466806