Items where authors include "Norris, D.J."

Article

Norris, D.J. and Walther, T. orcid.org/0000-0003-3571-6263 (2018) Stranski-Krastanow growth of (Si)Ge/Si(001): transmission electron microscopy compared with segregation theory. Materials Science and Technology, 34 (13). pp. 1539-1548. ISSN 0267-0836

Norris, D.J., Myronov, M., Leadley, D.R. et al. (1 more author) (2017) Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. Journal of Microscopy, 268 (3). pp. 288-297. ISSN 0022-2720

Proceedings Paper

Inkson, B.J. orcid.org/0000-0002-2631-9090, Olsen, S., Norris, D.J. et al. (2 more authors) (2003) 3D determination of a MOSFET gate morphology by FIB tomography. In: Cullis, A.G. and Midgley, P.A., (eds.) Microscopy of Semiconducting Materials 2003. Institute of Physics Conference 2003, 31 Mar - 03 Apr 2003, Cambridge, UK. CRC Press , pp. 611-616. ISBN 9781351074636

Walther, T. orcid.org/0000-0003-3571-6263, Cullis, A.G., Norris, D.J. et al. (1 more author) (2001) How InGaAs islands form on GaAs substrates: the missing link in the explanation of the Stranski-Krastanow transition. In: Cullis, A.G., (ed.) Microscopy of Semiconducting Materials 2001. 12th Conference on the Microscopy of Semiconducting Materials, 25-29 Mar 2001, Oxford, UK. Institute of Physics Conference Series (169). CRC Press , pp. 85-88.